Researchers from the University of Wollongong in Australia developed the silicon-based microdosimeter that can also assess the radiation damage to microelectronics.
Exposure to too much radiation can cause cancer, damage to the foetuses of pregnant women and genetic defects that can be passed onto future generations.
Professor Anatoly Rozenfeld, Director of the Centre for Medical Radiation Physics (CMRP) has just been granted a US patent for his invention.
"Silicon microdosimetry is providing a new metric for the estimation of hazards from ionizing radiation in mixed radiation fields. It is an essential contribution to radiation protection of pilots and astronauts in avionics and space, where the radiation environment is not easy to predict," Rozenfeld said in a statement.
Rozenfeld said the technology could also be used in advanced radiation oncology modalities (such as proton and heavy ion therapies) for cancer treatment.
Rozenfeld has also received a Chinese patent recently for a skin dosimetry technology that was 10 years in the making.
'Drop-in' accurately measures the amount of radiation absorbed into a patient's skin during procedures such as radiotherapy and CT scans that can give off high levels of ionising radiation.
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